Atomic Force Microscope

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CHAPTER # 00 FOREWORD ATOMIC FORCE MICROSCOPE CHAPTER # 01 THE MACHINE ATOMIC FORCE MICROSCOPE 1.1 INTRODUCTION: “Atomic force microscope (AFM) is a powerful technique used for investigating a wide range of properties on the nanometer scale.it is a very high resolution type of scanning probe microscopes, with established resolution of fractions of a nanometer, more than1000 times better than the optical diffraction limit.” Atomic force microscope (AFM) is a technique for analyzing the surface of almost all type of material all the way down to the level of the atom . AFM uses a mechanical probe to magnify surface features up to 100,000,000 times, and it produces 3-D images of the surface.Two key strengths of AFM are its ability to produce images in almost any environment—in air, vacuum, or solvent—and to measure a wide variety of physical properties of the sample The probe traverses the surface, attractive and repulsive forces arising between it and the atoms on the surface induce forces on the probe that bend the cantilever. The amount of bending is measured and recorded by monitoring the reflection of a laser spot off the top of the cantilever via an array of photodiodes. providing a map of the atoms on the surface. Atomic force microscopes can achieve magnification of a factor of 5 × 106, with a resolution of 2 angstroms, sufficient to resolve individual carbon atoms Fig: 02 showing the function. Methodology: The Atomic Force Microscope is an instrument that can analyze and characterize samples at the microscope level. This means we can look at surface characteristics with very accurate resolution ranging from 100 μm to less than 1μm. The Atomic Force Microscope was developed to overcome a basic drawback with STM - that it can only image conducting or semiconducting surfaces. The AFM, however, has the advantage of
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